Low Stress Ion Conductance Microscopy of Sub-Cellular Stiffness-Reference-Cited by-同舟云学术

Low Stress Ion Conductance Microscopy of Sub-Cellular Stiffness

Published:2016 Issue:38 Volume:12 Page:7953-7958
ISSN:1744-683X
Container-title:Soft Matter
language:en
Short-container-title:Soft Matter

Author:

Clarke Richard W.,Novak Pavel,Zhukov Alexander,Tyler Eleanor J.,Cano-Jaimez Marife,Drews Anna,Richards Owen,Volynski Kirill,Bishop Cleo,Klenerman David

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2016/SM/C6SM01106C

Reference30 articles.

1. The Scanning Ion-Conductance Microscope

2. Nanoscale live-cell imaging using hopping probe ion conductance microscopy

3. Nanoscale-Targeted Patch-Clamp Recordings of Functional Presynaptic Ion Channels

4. Pipette–Surface Interaction: Current Enhancement and Intrinsic Force

5. Rat hippocampal neurons in dispersed cell culture

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