Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite-Reference-Cited by-同舟云学术

Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite

Published:2016 Issue:1 Volume:31 Page:288-296
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

González-Gago C.¹²³⁴⁵,Pisonero J.¹²³⁴⁵,Sandín R.⁶⁷⁸⁹⁵,Fuertes J. F.¹²³⁴⁵,Sanz-Medel A.¹⁰²¹¹⁵,Bordel N.¹²³⁴⁵

Affiliation:

1. Department of Physics

2. University of Oviedo

3. Campus de Mieres

4. 33600 Mieres

5. Spain

6. R&D Department

7. Acciona Agua

8. S.A.U.

9. Barcelona

10. Department of Physical and Analytical Chemistry

11. 33006 Oviedo

Abstract

The capabilities of radiofrequency pulsed glow discharge time of flight mass spectrometry (rf-pulsed-GD-TOFMS) for the analysis of thin film composite membranes have been investigated in this work.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2016/JA/C5JA00104H

Reference26 articles.

1. A review of reverse osmosis membrane materials for desalination—Development to date and future potential

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