A round robin test for total reflection X-ray fluorescence analysis using preselected and well characterized samples-Reference-Cited by-同舟云学术

A round robin test for total reflection X-ray fluorescence analysis using preselected and well characterized samples

Published:2021 Issue:9 Volume:36 Page:1933-1945
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Unterumsberger Rainer¹^ORCID,Beckhoff Burkhard¹,Gross Armin²,Stosnach Hagen²,Nowak Sascha³^ORCID,Stenzel Yannick P.³,Krämer Markus⁴,von Bohlen Alex⁵^ORCID

Affiliation:

1. Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin, Germany

2. Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany

3. MEET – Battery Research Center Office, Corrensstr. 46, 48149 Münster, Germany

4. AXO DRESDEN GmbH, Gasanstaltstr. 8b, 01237 Dresden, Germany

5. Leibniz-Institut für Analytische Wissenschaften – ISAS – e.V., Bunsen-Kirchhoff-Str. 11, 44139 Dortmund, Germany

Abstract

A TXRF round robin test using preselected micro- and nanoscaled samples has been performed and shows excellent results, demonstrating the strength and reliability of the TXRF method when decoupled from unfavorable sample preparations.

Funder

Bundesministerium für Wirtschaft und Energie

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2021/JA/D1JA00103E

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