Determination of relative sensitivity factors of elements in high purity copper by doping-melting and doping-pressed methods using glow discharge mass spectrometry
Author:
Affiliation:
1. Department of Radiochemistry
2. China Institute of Atomic Energy
3. Beijing
4. PR China
5. National Institute of Metrology
Abstract
The calibration samples were prepared from high pure copper powder doped with standard solutions of graduated and defined concentration. And then a part of them was melted into bulks and another was pressed to tablets.
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2016/JA/C6JA00172F
Reference35 articles.
1. Detection limits for glow discharge mass spectrometry (GDMS) analyses of impurities in solar cell silicon
2. Glow discharge mass spectrometry
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4. Analysis of impurities with inhomogeneous distribution in multicrystalline solar cell silicon by glow discharge mass spectrometry
5. Determination of relative sensitivity factors for trace element analysis of solar cell silicon by fast-flow glow discharge mass spectrometry
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