Fourier transform infrared microscopy: some advances in techniques for characterisation and structure–property elucidations of industrial material†-Reference-Cited by-同舟云学术

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Fourier transform infrared microscopy: some advances in techniques for characterisation and structure–property elucidations of industrial material†

Published:1998 Issue:4 Volume:123 Page:579-586
ISSN:0003-2654
Container-title:The Analyst
language:
Short-container-title:Analyst

Author:

Chalmers John M.,Everall Neil J.,Hewitson Karen,Chesters Michael A.,Pearson Martin,Grady Andrew,Ruzicka Barbara

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1998/AN/A707070E

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