Quantification of impurities in diatomite <i>via</i> sensitivity-improved calibration-free laser-induced breakdown spectroscopy-Reference-Cited by-同舟云学术

Quantification of impurities in diatomite via sensitivity-improved calibration-free laser-induced breakdown spectroscopy

Published:2024 Issue: Volume: Page:
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Belkhir Nabila¹²^ORCID,Beldjilali Sid Ahmed¹^ORCID,Benelmouaz Mohamed Amine¹^ORCID,Hamzaoui Saad²^ORCID,Alloncle Anne-Patricia³^ORCID,Gerhard Christoph⁴^ORCID,Hermann Jörg³^ORCID

Affiliation:

1. Laboratoire de Physique des Plasmas, Matériaux Conducteurs et leurs Applications LPPMCA, Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf USTO-MB, BP 1505 El M'naouer, 31000 Oran, Algeria

2. Laboratoire de Microscopie Electronique & Sciences des Matériaux, Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf USTO-MB, BP 1505 El M'naouer, 31000 Oran, Algeria

3. Aix-Marseille University, CNRS, LP3, 13288 Marseille, France

4. Fakultät für Ingenieurwissenschaften und Technik, Hochschule für angewandte Wissenschaft und Kunst, Von-Ossietzky-Straße 99, 37085 Göttingen, Germany

Abstract

The detection of impurities in diatomite is a critical issue during the silicon extraction process.

Funder

Laserlab-Europe

Horizon 2020 Framework Programme

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/JA/D4JA00236A

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