Trace Element Determination Using ICP-OES

Abstract

Inductively coupled plasma-optical emission spectroscopy coupled with the benefits of solution chemistry serves as an excellent tool in trace element analysis (TEA) because of its multielement capability, large dynamic range of four to six orders of magnitude, and very high temperature in the range of 7000–10 000 K resulting in virtually complete atomization offering freedom from chemical interference by the formation of stable compounds such as oxides or carbides, especially in the case of refractories, common in the case of atomic absorption spectrometry. Coupling with hydride generation or a graphite rod overcomes the poor nebulizing efficiency of the technique, in the range of 1–2% (higher with humidified argon to 40 mg mL−1) as opposed to 5–10% in AAS. The robustness of plasma is helpful in the automation of plasma-based techniques such as ICP-OES. Advancements in the technique on the instrument side, for example a dual view combining axial and radial view configurations, a high resolution lower than 5 and 10 pm in the 160–320 and 320–800 nm ranges, respectively, suitable for analysis of nuclear fuel, mixed plasma gas, etc., would enhance the utility of the technique.