Mid- and far-infrared localized surface plasmon resonances in chalcogen-hyperdoped silicon

Author:

Wang Mao1ORCID,Yu Ye2ORCID,Prucnal Slawomir1ORCID,Berencén Yonder1ORCID,Shaikh Mohd Saif1ORCID,Rebohle Lars1ORCID,Khan Muhammad Bilal1ORCID,Zviagin Vitaly3,Hübner René1ORCID,Pashkin Alexej1ORCID,Erbe Artur14ORCID,Georgiev Yordan M.15ORCID,Grundmann Marius3ORCID,Helm Manfred16,Kirchner Robert24,Zhou Shengqiang1ORCID

Affiliation:

1. Helmholtz-Zentrum Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, Bautzner Landstraße 400, 01328 Dresden, Germany

2. Institute of Semiconductors and Microsystems, Technische Universität Dresden, 01062 Dresden, Germany

3. Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany

4. Centre for Advancing Electronics Dresden (CfAED), Technische Universität Dresden, 01062 Dresden, Germany

5. Institute of Electronics at the Bulgarian Academy of Sciences, 1784 Sofia, Bulgaria

6. Institut für Angewandte Physik (IAP), Technische Universität Dresden, 01062 Dresden, Germany

Abstract

The mid-infrared localized surface plasmon resonances are realized in hyperdoped Si and can be spectrally tuned by fabricating nano-antenna arrays. Our results are promising for the integration of plasmonic sensors into the on-chip CMOS platform.

Funder

Deutsche Forschungsgemeinschaft

Bundesministerium für Bildung und Forschung

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

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