Accumulation of counterions and coions evaluated by cryogenic XPS as a new tool for describing the structure of electric double layer at the silica/water interface-Reference-Cited by-同舟云学术

Accumulation of counterions and coions evaluated by cryogenic XPS as a new tool for describing the structure of electric double layer at the silica/water interface

Published:2017 Issue:43 Volume:19 Page:29047-29052
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Škvarla Jiří¹²³⁴^ORCID,Kaňuchová Mária¹²³⁴,Shchukarev Andrey⁵⁶⁷⁸,Brezáni Ivan¹²³⁴,Škvarla Juraj⁹¹⁰¹¹¹²

Affiliation:

1. Institute of Earth Resources

2. Technical University in Košice

3. 042 00 Košice

4. Slovak Republic

5. Department of Chemistry

6. Umeå University

7. S-901 87 Umeå

8. Sweden

9. Department of Physical and Macromolecular Chemistry

10. Charles University in Prague

11. 128 40 Prague 2

12. Czech Republic

Abstract

We introduce a new method of evaluating the structure of electric double layer (EDL) at the native solid/liquid interface using cryogenic X-ray photoelectron spectroscopy technique.

Funder

Vedecká Grantová Agentúra MŠVVaŠ SR a SAV

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2017/CP/C7CP06439J

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5. S. Durand-Vidal , J.-P.Simonin and P.Turq, Electrolytes at Interfaces, Kluwer Academic Press, Dordrecht, 2000, p. 344

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