Facile patterning using dry film photo-resists for flexible electronics: Ag nanowire networks and carbon nanotube networks

Author:

An Chee-Hong1234,Kim Sunho1234,Lee Hoo-Jeong1234,Hwang Byungil534ORCID

Affiliation:

1. School of Advanced Materials and Engineering

2. Sungkyunkwan University

3. Suwon

4. Republic of Korea

5. BASF Electronic Materials R&D Center Asia

Abstract

The Ag nanowire and CNT networks are patterned with a pattern width up to 30 μm by using dry film photo resists (DFRs). The systematic characterization of the electrical and mechanical properties of the patterned Ag nanowire networks revealed pattern width dependent property changes.

Funder

Ministry of Knowledge Economy

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

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