Vertical dielectric screening of few-layer van der Waals semiconductors
Author:
Affiliation:
1. Department of Physics
2. Washington University in St. Louis
3. St. Louis
4. USA
5. Konkuk University
6. Seoul 05029
7. Korea
8. Institute of Materials Science and Engineering
Abstract
Vertical dielectric screening is a fundamental parameter of few-layer van der Waals two-dimensional (2D) semiconductors.
Funder
National Science Foundation
Konkuk University
Division of Materials Research
Publisher
Royal Society of Chemistry (RSC)
Subject
General Materials Science
Link
http://pubs.rsc.org/en/content/articlepdf/2017/NR/C7NR04134A
Reference43 articles.
1. Electric Field Effect in Atomically Thin Carbon Films
2. Black phosphorus field-effect transistors
3. Single-layer MoS2 transistors
4. Mobility engineering and a metal–insulator transition in monolayer MoS2
5. Ab initiostudy of polarizability and induced charge densities in multilayer graphene films
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Toward direct band gaps in typical 2D transition-metal dichalcogenides junctions via real and energy spaces tuning;Communications Materials;2024-09-13
2. Tunnel junctions based on interfacial two dimensional ferroelectrics;Nature Communications;2024-05-24
3. Vertical Dielectric of Conducting Functionalized Few-Layer MoS2;ACS Applied Nano Materials;2023-08-03
4. Interlayer Charge-Transfer-Induced Photoluminescence Quenching and Enhanced Photoconduction in Two-Dimensional Bi2O2Se/MoS2 Type-II Heterojunction;ACS Applied Nano Materials;2023-06-28
5. Shell effects on the dielectric properties of core–shell quantum dots;The Journal of Chemical Physics;2023-03-28
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3