In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2 detection-Reference-Cited by-同舟云学术

In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2 detection

Published:2020 Issue:70 Volume:56 Page:10147-10150
ISSN:1359-7345
Container-title:Chemical Communications
language:en
Short-container-title:Chem. Commun.

Author:

Toyoshima Ryo¹²³⁴⁵,Tanaka Takahisa⁶⁷⁸⁹⁵,Kato Taro⁶⁷⁸⁹⁵,Uchida Ken⁶⁷⁸⁹⁵,Kondoh Hiroshi¹²³⁴⁵^ORCID

Affiliation:

1. Department of Chemistry

2. Keio University

3. 3-14-1 Hiyoshi

4. Yokohama

5. Japan

6. Department of Materials Engineering

7. The University of Tokyo

8. 7-3-1 Hongo

9. Tokyo

Abstract

Changes in surface chemical state of a resistivity-based Pt thin-film sensor for H₂ gas were observed under working conditions with direct in situ spectroscopy.

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,General Chemistry,Ceramics and Composites,Electronic, Optical and Magnetic Materials,Catalysis

Link

http://pubs.rsc.org/en/content/articlepdf/2020/CC/D0CC04030D

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