Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems-Reference-Cited by-同舟云学术

Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems

Published:2017 Issue:24 Volume:142 Page:4801-4811
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Bertasa Moira¹²³⁴⁵^ORCID,Possenti Elena¹²³⁴⁶,Botteon Alessandra¹²³⁴,Conti Claudia¹²³⁴^ORCID,Sansonetti Antonio¹²³⁴,Fontana Raffaella⁷⁸⁴,Striova Jana⁷⁸⁴,Sali Diego⁹³⁴

Affiliation:

1. Consiglio Nazionale delle Ricerche

2. Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (ICVBC)

3. Milano

4. Italy

5. Dipartimento di Chimica

6. Dipartimento di Scienze della Terra

7. Consiglio Nazionale delle Ricerche - Istituto Nazionale di Ottica (CNR-INO)

8. Firenze

9. Bruker Italia S.r.l. Unipersonale

Abstract

This paper demonstrates the potentiality of high resolution micro-ATR-FTIR to reconstruct micrometric layers images.

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2017/AN/C7AN00873B

Reference43 articles.

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