Composition and thickness determination of thin oxide films: comparison of different programs and methods-Reference-Cited by-同舟云学术

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Composition and thickness determination of thin oxide films: comparison of different programs and methods

Published:1999 Issue:3 Volume:14 Page:523-527
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:
Short-container-title:J. Anal. At. Spectrom.

Author:

Sammelselg V.,Aarik J.,Aidla A.,Kasikov A.,Heikinheimo E.,Peussa M.,Niinist L.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1999/JA/A806762G

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