Electron and hole trapping in Eu- or Eu,Hf-doped LuPO4 and YPO4 tracked by EPR and TSL spectroscopy-Reference-Cited by-同舟云学术

Electron and hole trapping in Eu- or Eu,Hf-doped LuPO4 and YPO4 tracked by EPR and TSL spectroscopy

Published:2019 Issue:37 Volume:7 Page:11473-11482
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Laguta Valentin¹²³^ORCID,Buryi Maksym¹²³,Nikl Martin¹²³^ORCID,Zeler Justyna⁴⁵⁶⁷⁸^ORCID,Zych Eugeniusz⁸⁹¹⁰¹¹^ORCID,Bettinelli Marco¹²¹³¹⁴¹⁵¹⁶^ORCID

Affiliation:

1. Institute of Physics CAS Prague

2. Prague

3. Czech Republic

4. Department of Physics CICECO-Aveiro Institute of Materials

5. University of Aveiro Campus de Santiago

6. Aveiro

7. Portugal

8. Faculty of Chemistry

9. University of Wroclaw

10. 50-383 Wroclaw

11. Poland

12. Luminescent Materials Laboratory

13. Department of Biotechnology

14. University of Verona and INSTM

15. UdR Verona

16. 37134 Verona

Abstract

EPR spectroscopy in X- and Q-bands was employed to trace charge carrier trapping upon exposure to X-rays of LuPO₄:Eu, LuPO₄:Eu,Hf and YPO₄:Eu,Hf flux-grown single crystals, as well as LuPO₄:Eu sintered ceramics.

Funder

Ministerstvo Školství, Mládeže a Tělovýchovy

Grantová Agentura České Republiky

Narodowe Centrum Nauki

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/TC/C9TC03507A

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