Affiliation:
1. Electronic Materials Laboratory, Electrical Engineering Department, K. N. Toosi University of Technology, Tehran 16317-14191, Iran
Abstract
Electronic features of interfaces formed between ZnO thin films and Ti, Al, Zn, and Bi are investigated. The contacts are ohmic, but produce different contact resistances. The results are correlated with the DOS of the respective metals at their EF.
Publisher
Royal Society of Chemistry (RSC)
Cited by
1 articles.
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