In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation-Reference-Cited by-同舟云学术

In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation

Published:2008 Issue:10 Volume:23 Page:1378
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Malherbe Julien,Fernández Beatriz,Martinez Hervé,Chapon Patrick,Panjan Peter,Donard Olivier F. X.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2008/JA/B803713B

Reference36 articles.

1. Guidelines for terms related to chemical speciation and fractionation of elements. Definitions, structural aspects, and methodological approaches (IUPAC Recommendations 2000)

2. Trace element analytical speciation in biological systems: importance, challenges and trends

3. Possibilities of space-resolved solid-state speciation

4. Radio-frequency glow discharge spectrometry:

5. Glow-discharge spectrometry for direct analysis of thin and ultra-thin solid films

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