Pore collapse and regrowth in silicon electrodes for rechargeable batteries

Author:

DeCaluwe S. C.12345,Dhar B. M.67839,Huang L.6783,He Y.678310,Yang K.6783,Owejan J. P.117123,Zhao Y.1013143,Talin A. A.15516317,Dura J. A.45163,Wang H.18192036

Affiliation:

1. Department of Mechanical Engineering

2. Colorado School of Mines

3. USA

4. Center for Neutron Research

5. National Institute of Standards and Technology

6. Institute for Materials Research and Dept. of Mechanical Engineering

7. State University of New York

8. Binghamton

9. Material Measurement Laboratory

10. Department of Physics and Astronomy

11. Department of Mechanical and Electrical Engineering Technology

12. Alfred

13. University of Georgia

14. Athens

15. Center for Nanoscale Science and Technology

16. Gaithersburg

17. Sandia National Laboratories

18. Department of Materials Science and Engineering

19. University of Maryland

20. College Park

Abstract

In-operando Neutron Reflectometry establishes the pore collapse and regrowth (PCRG) mechanism in amorphous Si. Upon lithiation, porosity is first consumed by expansion of solid Si domains, with little thickness increase. After, the whole film expands. Porosity returns upon delithiation.

Funder

Advanced Research Projects Agency - Energy

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

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