The influence of dislocations on optical and electrical properties of epitaxial ZnO on Si (111) using a γ-Al2O3buffer layer-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The influence of dislocations on optical and electrical properties of epitaxial ZnO on Si (111) using a γ-Al2O3buffer layer

Published:2012 Issue:5 Volume:14 Page:1665-1671
ISSN:1466-8033
Container-title:CrystEngComm
language:en
Short-container-title:CrystEngComm

Author:

Liu W.-R.,Lin B. H.,Yang S.,Kuo C. C.,Li Y.-H.,Hsu C.-H.,Hsieh W. F.,Lee W. C.,Hong M.,Kwo J.

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2012/CE/C2CE06218F

Reference46 articles.

1. High temperature excitonic stimulated emission from ZnO epitaxial layers

2. V defects of ZnO thin films grown on Si as an ultraviolet optical path

3. Properties of nitrogen-implanted p-type ZnO films grown on Si3N4/Si by radio-frequency magnetron sputtering

4. The substrate effect on the in-plane orientation of vertically well-aligned ZnO nanorods grown on ZnO buffer layers

5. Correlation between crystal structure and photoluminescence for epitaxial ZnO on Si (1 1 1) using a γ-Al2O3buffer layer

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ZnO nanorods on conductive substrates. Technology and features;Nano-Structures & Nano-Objects;2023-07

2. Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations;Applied Physics Letters;2019-12-02

3. Photoluminescence, conductivity and structural study of terbium doped ZnO films grown on different substrates;Materials Science in Semiconductor Processing;2019-05

4. Highly stable barium zirconate supported nickel oxide catalyst for dry reforming of methane: From powders toward shaped catalysts;International Journal of Hydrogen Energy;2018-06

5. Light emission from anm-plane n-ZnO/p-Si heterojunction with an AlN interlayer;Applied Physics Express;2016-12-21

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3