Customized MFM probes based on magnetic nanorods

Author:

Jaafar Miriam12345ORCID,Pablo-Navarro Javier6784ORCID,Berganza Eider593410,Ares Pablo1234ORCID,Magén César678411,Masseboeuf Aurélien12131415,Gatel Christophe12131415,Snoeck Etienne12131415,Gómez-Herrero Julio1234,de Teresa José María678411ORCID,Asenjo Agustina5934ORCID

Affiliation:

1. Departamento de Física de la Materia Condensada and Condensed Matter Physics Center (IFIMAC)

2. Universidad Autónoma de Madrid

3. 28049 Madrid

4. Spain

5. Instituto de Ciencia de Materiales de Madrid (ICMM)

6. Laboratorio de Microscopías Avanzadas (LMA) - Instituto de Nanociencia de Aragón (INA)

7. Universidad de Zaragoza

8. 50018 Zaragoza

9. CSIC

10. Institute of Nanotechnology

11. Instituto de Ciencia de Materiales de Aragón (ICMA)

12. CEMES

13. CNRS

14. F-31055 Toulouse

15. France

Abstract

Focused Electron Beam Induced Deposition (FEBID) for magnetic tip fabrication is presented in this work as an alternative to conventional sputtering-based Magnetic Force Microscopy (MFM) tips.

Funder

Ministerio de Economía y Competitividad

Universidad Autónoma de Madrid

Comunidad de Madrid

European Social Fund

Horizon 2020 Framework Programme

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

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