Trapping during hopping conduction of electronic defects: A conductivity model for doped transition metal oxides
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2004/CP/B402156H
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1. Die elektrische Leitfähigkeit der Oxyde des Kobalts und Eisens (Mit einem Anhang über Rekristallisation von Zinkoxyd)
2. Electrical Properties of Cobalt Monoxide
3. Hall mobility and defect structure in undoped and Cr or Ti-doped CoO at high temperature
4. The contribution of different types of point defects to diffusion in CoO and NiO during oxidation of the metals
5. Cobaltous Oxide Point Defect Structure and Non-Stoichiometry, Electrical Conductivity, Cobalt Tracer Diffusion
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