The role of spontaneous orientation polarization on charge storage behavior at an interface between organic semiconductor layers-Reference-Cited by-同舟云学术

The role of spontaneous orientation polarization on charge storage behavior at an interface between organic semiconductor layers

Published:2024 Issue:3 Volume:12 Page:1055-1060
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Yamanaka Takahiko¹^ORCID,Nakanotani Hajime²³^ORCID,Adachi Chihaya²³^ORCID

Affiliation:

1. Central Research Laboratory, Hamamatsu Photonics K.K, 5000 Hirakuchi, Hamakita-ku, Hamamatsu, Shizuoka 434-8601, Japan

2. Center for Organic Photonics and Electronics Research (OPERA), Department of Applied Chemistry, Kyushu University, 744 Motooka, Nishi, Fukuoka 819-0395, Japan

3. International Institute for Carbon Neutral Energy Research (WPI-I2CNER), Kyushu University, 744 Motooka, Nishi 819-0395, Fukuoka, Japan

Abstract

Optically generated carriers are pinned at the organic/organic interface if the two organic layers have a large polarization difference, underlining that the combination of polar molecules is crucial to extend the carrier lifetime.

Funder

Japan Society for the Promotion of Science

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2024/TC/D3TC03979J

Reference27 articles.

1. Spontaneous buildup of giant surface potential by vacuum deposition of Alq3 and its removal by visible light irradiation

2. An assessment of the role of dipoles on the density‐of‐states function of disordered molecular solids

3. Understanding spontaneous orientation polarization of amorphous organic semiconducting films and its application to devices

4. Spontaneous formation of metastable orientation with well-organized permanent dipole moment in organic glassy films

5. Examination of Spontaneous Orientation Polarization in Wet‐Processed Tris(8‐hydroxyquinolinato)aluminum Film Measured by Rotary Kelvin Probe Method