On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I/V curves-Reference-Cited by-同舟云学术

On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I/V curves

Published:2020 Issue:46 Volume:22 Page:26702-26706
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Delmas Vincent¹²³⁴⁵^ORCID,Diez-Cabanes Valentin⁶⁷²⁸⁵^ORCID,van Dyck Colin⁹¹⁰¹¹¹²^ORCID,Scheer Elke¹³¹⁰¹⁴¹⁵^ORCID,Costuas Karine¹²³⁴⁵^ORCID,Cornil Jérôme⁹¹⁰¹¹¹²^ORCID

Affiliation:

1. Univ Rennes

2. CNRS

3. ISCR (Institut des Sciences Chimiques de Rennes) – UMR 6226

4. F-35000 Rennes

5. France

6. Université de Lorraine

7. Laboratoire de Physique et Chimie Théoriques

8. F-54506 Vandoeuvre-les-Nancy

9. University of Mons

10. Department of Physics

11. B-7000 Mons

12. Belgium

13. University of Konstanz

14. 78457 Konstanz

15. Germany

Abstract

A new fitting algorithm based on the low-bias conductance and Seebeck coefficient provides reliable values of key electronic parameters in molecular junctions.

Funder

Grand Équipement National De Calcul Intensif

Fonds De La Recherche Scientifique - FNRS

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2020/CP/D0CP05372D

Reference33 articles.

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4. Advance of Mechanically Controllable Break Junction for Molecular Electronics

5. Direct Optical Determination of Interfacial Transport Barriers in Molecular Tunnel Junctions

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