Depth profiling of Al diffusion in silicon wafers by laser-induced breakdown spectroscopy
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2013/JA/C3JA50115A
Reference18 articles.
1. Application of laser-induced breakdown spectrometry for direct determination of trace elements in starch-based flours
2. Development of a method for automated quantitative analysis of ores using LIBS
3. On-line monitoring of remediation process of chromium polluted soil using LIBS
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5. Laser ablation in liquids as a new technique of sampling in elemental analysis of solid materials
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