Affiliation:
1. National Institute of Materials Physics, Atomiştilor 405A, 077125 Măgurele-Ilfov, Romania
2. Department of Interface Science, Fritz-Haber Institute of the Max Planck Society, 14195 Berlin, Germany
Abstract
Probing of the free surface ferroelectric properties of thin polar films can be achieved either by estimating the band bending variance under the top-most layer or studying the extent of extrinsic charge accumulated outside the surface.
Funder
Ministerul Cercetării şi Inovării
Bundesministerium für Bildung und Forschung
Institutul de Fizică Atomică
Unitatea Executiva pentru Finantarea Invatamantului Superior, a Cercetarii, Dezvoltarii si Inovarii
Alexander von Humboldt-Stiftung
Deutsche Forschungsgemeinschaft
Max-Planck-Gesellschaft
Publisher
Royal Society of Chemistry (RSC)
Subject
General Materials Science
Cited by
4 articles.
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