Plasmonic hole ejection involved in plasmon-induced charge separation-Reference-Cited by-同舟云学术

Plasmonic hole ejection involved in plasmon-induced charge separation

Published:2020 Issue:4 Volume:5 Page:597-606
ISSN:2055-6756
Container-title:Nanoscale Horizons
language:en
Short-container-title:Nanoscale Horiz.

Author:

Tatsuma Tetsu¹²³⁴^ORCID,Nishi Hiroyasu¹²³⁴

Affiliation:

1. Institute of Industrial Science

2. The University of Tokyo

3. Meguro-ku

4. Japan

Abstract

Hot hole ejection from the resonance sites of plasmonic nanoparticles on a semiconductor or an electrode enables oxidation at more positive potentials, output of higher voltage, and site-selective photo-oxidation beyond the diffraction limit.

Funder

Japan Society for the Promotion of Science

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NH/C9NH00649D

Reference105 articles.

1. Mechanisms and Applications of Plasmon-Induced Charge Separation at TiO2 Films Loaded with Gold Nanoparticles

2. Solid state photovoltaic cells based on localized surface plasmon-induced charge separation

3. Plasmon-induced charge separation: chemistry and wide applications

4. Multicolour photochromism of TiO2 films loaded with silver nanoparticles

5. Electrochemical Photolysis of Water at a Semiconductor Electrode

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