Effect of annealing conditions on the electrical properties of ALD-grown polycrystalline BiFeO3 films-Reference-Cited by-同舟云学术

Effect of annealing conditions on the electrical properties of ALD-grown polycrystalline BiFeO3 films

Author:

Golovina Iryna S.¹²³⁴⁵,Falmbigl Matthias¹²³⁴,Plokhikh Aleksandr V.¹²³⁴,Parker Thomas C.⁶⁷⁴,Johnson Craig¹²³⁴,Spanier Jonathan E.¹²³⁴⁸^ORCID

Affiliation:

1. Department of Materials Science & Engineering

2. Drexel University

3. Philadelphia

4. USA

5. Institute of Semiconductor Physics

6. US Army Research Laboratory

7. Aberdeen Proving Ground

8. Department of Electrical & Computer Engineering

Abstract

We show that a proper selection of annealing conditions is crucial for optimizing the properties of ALD-grown BiFeO₃ thin films.

Funder

Office of Naval Research

Army Research Laboratory

Division of Materials Research

Division of Chemical, Bioengineering, Environmental, and Transport Systems

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

Reference67 articles.

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