Tuning the orientation of few-layer MoS2 films using one-zone sulfurization

Author:

Sojková Michaela1234ORCID,Vegso Karol52647,Mrkyvkova Nada52647,Hagara Jakub5264,Hutár Peter1234,Rosová Alica1234,Čaplovičová Mária8910,Ludacka Ursula11121314,Skákalová Viera89101112,Majková Eva52647,Siffalovic Peter52647ORCID,Hulman Martin1234

Affiliation:

1. Institute of Electrical Engineering

2. SAS

3. 84104 Bratislava

4. Slovakia

5. Institute of Physics

6. 84511 Bratislava

7. Centre for Advanced Materials Application

8. STU Centre for Nanodiagnostics

9. 81243 Bratislava

10. Slovak Republic

11. University of Vienna

12. Faculty of Physics

13. 1090 Vienna

14. Austria

Abstract

Schematic representation of the GIWAXS measurements on HA and VA MoS2 layers.

Funder

Agentúra na Podporu Výskumu a Vývoja

Vedecká Grantová Agentúra MŠVVaŠ SR a SAV

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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