Quantification of C, H, N and O in polymers using WDXRF scattering spectra and PLS regression depending on the spectral resolution-Reference-Cited by-同舟云学术

Quantification of C, H, N and O in polymers using WDXRF scattering spectra and PLS regression depending on the spectral resolution

Published:2022 Issue:4 Volume:37 Page:861-869
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Breuckmann Michael¹^ORCID,Wacker Georg¹²³^ORCID,Hanning Stephanie¹^ORCID,Otto Matthias²^ORCID,Kreyenschmidt Martin¹^ORCID

Affiliation:

1. University of Applied Sciences Münster, Department of Chemical Engineering, Laboratory of Instrumental Analytics, Stegerwaldstraße 39, 48565 Steinfurt, Germany

2. Technical University Bergakademie Freiberg, Faculty of Chemistry and Physics, Institute of Analytical Chemistry, Leipziger Straße 29, 09599 Freiberg, Germany

3. VDM Metals GmbH, Plettenberger Str. 2, 58791 Werdohl, Germany

Abstract

The C, H, N and O composition of polymers, sometimes called “dark matrix”, is determined by wavelength dispersive X-ray fluorescence (WDXRF). The recovery was best for the lowest spectral resolution and highest recorded intensity.

Funder

Bundesministerium für Bildung und Forschung

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/JA/D1JA00412C

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