Dynamically blocking leakage current in molecular tunneling junctions-Reference-Cited by-同舟云学术

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Dynamically blocking leakage current in molecular tunneling junctions

Published:2024 Issue:32 Volume:15 Page:12721-12731
ISSN:2041-6520
Container-title:Chemical Science
language:en
Short-container-title:Chem. Sci.

Author:

Xie Yu¹,Qiu Shengzhe¹,Guo Qianqian²,Li Chengtai³,Chen Ningyue¹,Zhou Ziming¹,Yang Zhenyu¹,Cao Zhou¹,Wang Tao²^ORCID,Du Wei²,Wang Lejia³,Li Yuan¹^ORCID

Affiliation:

1. Key Laboratory of Organic Optoelectronics and Molecular Engineering, Department of Chemistry, Tsinghua University, Beijing, 100084, P. R. China

2. Institute of Functional Nano & Soft Materials (FUNSOM), Soochow University, Suzhou, Jiangsu, 215123, P. R. China

3. School of Materials and Chemical Engineering, Ningbo University of Technology, Ningbo, Zhejiang, 315211, P. R. China

Abstract

Incorporating mixed flexible-rigid backbones into molecular junctions can dynamically block tunneling currents and enhance rectification.

Funder

National Natural Science Foundation of China

Tsinghua University

Tsinghua Initiative Scientific Research Program

Suzhou Key Laboratory of Functional Nano and Soft Materials

Collaborative Innovation Center of Suzhou Nano Science and Technology

Higher Education Discipline Innovation Project

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/SC/D4SC02829E

Reference49 articles.

1. Dynamical memristors for higher-complexity neuromorphic computing

2. Vertical MoS2 transistors with sub-1-nm gate lengths

3. Graphene–molecule–graphene single-molecule junctions to detect electronic reactions at the molecular scale

4. In this issue

5. Photooxidation driven formation of Fe-Au linked ferrocene-based single-molecule junctions

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