Towards a unified description of the charge transport mechanisms in conductive atomic force microscopy studies of semiconducting polymers-Reference-Cited by-同舟云学术

Towards a unified description of the charge transport mechanisms in conductive atomic force microscopy studies of semiconducting polymers

Published:2014 Issue:18 Volume:6 Page:10596-10603
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Moerman D.¹²³⁴,Sebaihi N.¹²³⁴,Kaviyil S. E.⁵⁶⁷,Leclère P.¹²³⁴,Lazzaroni R.¹²³⁴⁸,Douhéret O.⁸⁴

Affiliation:

1. Laboratory for Chemistry of Novel Materials

2. Center for Innovation and Research in Materials and Polymers – CIRMAP

3. University of Mons – UMONS

4. B-7000 Mons, Belgium

5. Department of Materials Science

6. University of Milano-Bicocca

7. 20125 Milan, Italy

8. Materia Nova Materials R&D Center

Abstract

The nanoscale electrical properties of fibrillate poly-3-hexylthiophene are studied using conducting-AFM. The conditions for the prevalence of either local or bulk resistances dominated regime are identified. As local current is space charge limited, an analytical model is derived to determine locally carrier mobility and density.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2014/NR/C4NR02577F

Reference36 articles.

1. The path to ubiquitous and low-cost organic electronic appliances on plastic

2. Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

3. Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy

4. High resolution electrical characterisation of organic photovoltaic blends

5. Space Charge Limited Current Measurements on Conjugated Polymer Films using Conductive Atomic Force Microscopy

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