In situ surface monitoring of energy materials during processing: impact of defect disorder on surface versus bulk semiconducting properties of photocatalytic hematite (Fe2O3)

Author:

Bak T.1ORCID,StC. Black D.23ORCID,Gannon P.4ORCID,Gür T. M.5ORCID,Jasiuk I.6ORCID,Sherif S. A.7ORCID,Sigmund W. M.8ORCID,Nowotny J.31ORCID

Affiliation:

1. Western Sydney University, School of Computer Data and Mathematical Sciences, Penrith, NSW 2751, Australia

2. School of Chemistry, University of New South Wales, Sydney, NSW 2052, Australia

3. Sustainable Energy Initiative Pty Ltd, 2 Hebron Ave, Mt Pleasant, NSW 2519, Australia

4. Chemical and Biological Engineering, Montana State University, Bozeman, MT 59717, USA

5. Department of Materials Science and Engineering, Stanford333 University, Stanford, CA 94305-4034, USA

6. Department of Mechanical Science and Engineering, University of Illinois at Urbana, Champaign, IL 61801, USA

7. Department of Mechanical and Aerospace Engineering, University of Florida, 1064 Center Drive, Room 181 NEB Building, Gainesville, FL 32611, USA

8. Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611-6400, USA

Abstract

Rational design of surface properties of oxide semiconductors for energy conversion requires in situ surface characterization.

Publisher

Royal Society of Chemistry (RSC)

Reference39 articles.

1. Recent Development in Defects Engineered Photocatalysts: An Overview of the Experimental and Theoretical Strategies

2. P.Kofstad , Nonstoichiometry, Diffusion and Electrical Conductivity in Binary Metal Oxides , Wiley , New York , 1972

3. S.Mrowec , Defects and Diffusion in Solids , Elsevier , Amsterdam , 1980

4. Chemisorption and charge transfer at ionic semiconductor surfaces: Implications in designing gas sensors

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