Affiliation:
1. College of Chemistry and Chemical Engineering, Inner Mongolia University, Hohhot 010021, P. R. China
Abstract
Decreasing the charge density of trap states via electron acceptor and hole injection can eliminate the charge recombination centers and prolong the carrier lifetimes.
Funder
Education Department of Inner Mongolia Autonomous Region
Natural Science Foundation of Inner Mongolia Autonomous Region
National Natural Science Foundation of China
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy