Measuring methods for thermoelectric properties of one-dimensional nanostructural materials-Reference-Cited by-同舟云学术

Measuring methods for thermoelectric properties of one-dimensional nanostructural materials

Published:2016 Issue:54 Volume:6 Page:48933-48961
ISSN:2046-2069
Container-title:RSC Advances
language:en
Short-container-title:RSC Adv.

Author:

Liu Yang¹²³⁴⁵,Zhang Mingliang¹²³⁴⁵,Ji An¹²³⁴⁵,Yang Fuhua¹²³⁴⁵,Wang Xiaodong¹²³⁴⁵

Affiliation:

1. Engineering Research Center for Semiconductor Integrated Technology

2. Institute of Semiconductors

3. Chinese Academy of Sciences

4. Beijing 100083

5. China

Abstract

Measuring methods for the Seebeck coefficient and thermal conductivity of 1D nanostructural materials have been reviewed and structures, principles, merits and shortcomings, as well as examples of each method are discussed in detail.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2016/RA/C5RA23634G

Reference247 articles.

1. Cooling, Heating, Generating Power, and Recovering Waste Heat with Thermoelectric Systems

2. Design of vanadium oxide structures with controllable electrical properties for energy applications

3. Amphoteric oxide semiconductors for energy conversion devices: a tutorial review

4. Mesoporous materials for clean energy technologies

5. T. J. Seebeck , Abhandlungen der Deustchen Akademi der Wissenschaften zu Berlin, 1823, pp. 265–373

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A short account of thermoelectric film characterization techniques;Materials Today Physics;2023-08

2. Thermoelectric PEDOT measurement techniques;Advanced PEDOT Thermoelectric Materials;2022

3. Si and SiGe Nanowire for Micro-Thermoelectric Generator: A Review of the Current State of the Art;Frontiers in Materials;2021-03-26

4. Thermoelectric effect and devices on IVA and VA Xenes;InfoMat;2021-01-24

5. A Robust System for Thermoelectric Device Characterization;IEEE Transactions on Instrumentation and Measurement;2021