Effects of H2O- and O2-containing He carrier gases on the 206Pb/238U system bias and down-hole fractionation in LA-ICPMS of zircon-Reference-Cited by-同舟云学术

Effects of H2O- and O2-containing He carrier gases on the 206Pb/238U system bias and down-hole fractionation in LA-ICPMS of zircon

Published:2017 Issue:11 Volume:32 Page:2238-2245
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Allner Steffen¹²³⁴^ORCID,Koch Joachim¹²³⁴^ORCID,Jackson Simon E.⁵⁶⁷,Günther Detlef¹²³⁴

Affiliation:

1. ETH Zurich

2. Laboratory of Inorganic Chemistry

3. CH-8093 Zurich

4. Switzerland

5. Geological Survey of Canada

6. Ottawa

7. Canada

Abstract

The effects of He + X (X = H₂O or O₂) carrier gases on the ²⁰⁶Pb/²³⁸U system bias and down-hole fractionation in LA-ICPMS of natural zircon and NIST SRM610 are reported.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2017/JA/C7JA00017K

Reference34 articles.

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3. Effect of oxygen in sample carrier gas on laser-induced elemental fractionation in U–Th–Pb zircon dating by laser ablation ICP-MS

4. The zircon ‘matrix effect’: evidence for an ablation rate control on the accuracy of U–Pb age determinations by LA-ICP-MS

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