In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface-Reference-Cited by-同舟云学术

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In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface

Published:2012 Issue:3 Volume:27 Page:390
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Escobar Galindo R.,Benito N.,Duday D.,Fuentes G. G.,Valle N.,Herrero P.,Vergara L.,Joco V.,Sanchez O.,Arranz A.,Palacio C.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2012/JA/C2JA10296J

Reference38 articles.

1. Zirconium Doping in Titanium Oxide Photocatalytic Films Prepared by Atomic Layer Deposition

2. Direct Formation of Zirconia-Doped Titania with Stable Anatase-Type Structure by Thermal Hydrolysis

3. Molybdenum-Doped Anatase and Its Extraordinary Photocatalytic Activity in the Degradation of Orange II in the UV and vis Regions

4. Preparation and photocatalytic activity of ZnO/TiO2/SnO2 mixture

5. Nanostructured Ti–M mixed-metal oxides: Toward a visible light-driven photocatalyst

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