In situ techniques reveal the true capabilities of SOFC cathode materials and their sudden degradation due to omnipresent sulfur trace impurities

Author:

Riedl Christoph1ORCID,Siebenhofer Matthäus12ORCID,Nenning Andreas1ORCID,Schmid Alexander1ORCID,Weiss Maximilian1ORCID,Rameshan Christoph3ORCID,Limbeck Andreas1ORCID,Kubicek Markus1ORCID,Opitz Alexander Karl1ORCID,Fleig Juergen1ORCID

Affiliation:

1. Institute of Chemical Technologies and Analytics, TU Wien, Getreidemarkt 9-E164, 1060 Vienna, Austria

2. CEST Kompetenzzentrum für Elektrochemische Oberflächentechnologie GmbH, TFZ – Wiener Neustadt, Viktor-Kaplan-Strasse 2, 2700 Wiener Neustadt, Austria

3. Institute of Materials Chemistry, TU Wien, Getreidemarkt 9-E165-PC, 1060 Vienna, Austria

Abstract

In this study, the effect of sulphur contamination on pristine SOFC cathode materials is revealed by in situ impedance spectroscopy directly after growth inside the PLD chamber (i-PLD) and ambient pressure XPS measurements (AP-XPS).

Funder

Horizon 2020 Framework Programme

Austrian Science Fund

Österreichische Forschungsförderungsgesellschaft

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment,General Chemistry

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