Resolving the optical anisotropy of low-symmetry 2D materials-Reference-Cited by-同舟云学术

Resolving the optical anisotropy of low-symmetry 2D materials

Published:2018 Issue:17 Volume:10 Page:8329-8337
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Shen Wanfu¹²³⁴^ORCID,Hu Chunguang¹²³⁴^ORCID,Tao Jin⁵⁶⁷⁴,Liu Jun¹²³⁴,Fan Shuangqing¹²³⁴,Wei Yaxu¹²³⁴,An Chunhua¹²³⁴,Chen Jiancui¹²³⁴,Wu Sen¹²³⁴,Li Yanning¹²³⁴,Liu Jing¹²³⁴^ORCID,Zhang Daihua¹²³⁴,Sun Lidong⁸⁹¹⁰¹¹,Hu Xiaotang¹²³⁴

Affiliation:

1. State Key Laboratory of Precision Measuring Technology and Instruments

2. Tianjin University

3. CN-300072 Tianjin

4. China

5. Changchun Institute of Optics and Fine Mechanics and Physics

6. Chinese Academy of Science

7. CN-130033 Changchun

8. Institute of Experimental Physics

9. Johannes Kepler University Linz

10. A-4040 Linz

11. Austria

Abstract

Azimuthal-dependence reflectance difference microscopy was developed to visualize and characterize the optical anisotropy of low-symmetry 2D materials.

Funder

National Natural Science Foundation of China

Ministry of Education of the People's Republic of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2018/NR/C7NR09173G

Reference57 articles.

1. Black phosphorus field-effect transistors

2. Phosphorene: An Unexplored 2D Semiconductor with a High Hole Mobility