Recent advances in secondary ion mass spectrometry of solid acid catalysts: large zeolite crystals under bombardment

Author:

Hofmann Jan P.12345,Rohnke Marcus678,Weckhuysen Bert M.1234

Affiliation:

1. Inorganic Chemistry and Catalysis

2. Debye Institute for Nanomaterials Science

3. Utrecht University

4. 3584 CG Utrecht, The Netherlands

5. Inorganic Materials Chemistry

6. Institute of Physical Chemistry

7. Justus-Liebig University Giessen

8. 35392 Giessen, Germany

Abstract

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is used for the characterization of heterogeneous catalysts. Large zeolite ZSM-5 crystals are discussed as a showcase system for solid acid catalysts and studied in high-resolution mass spectrometry, imaging, and sputter-depth profiling modes.

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Reference52 articles.

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