Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers
Author:
Affiliation:
1. Institute of Materials
2. École Polytechnique Fédérale de Lausanne (EPFL)
3. 1015 Lausanne
4. Switzerland
Abstract
In-depth analysis of self-assembled monolayers by bimodal atomic force microscopy.
Publisher
Royal Society of Chemistry (RSC)
Subject
General Materials Science
Link
http://pubs.rsc.org/en/content/articlepdf/2018/NR/C8NR07657J
Reference80 articles.
1. Formation and Structure of Self-Assembled Monolayers
2. Structure and growth of self-assembling monolayers
3. Molecular engineering of Surfaces Using Self-Assembled Monolayers
4. Self-Assembled Monolayers of Thiolates on Metals as a Form of Nanotechnology
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