Mechanistical studies on the electron-induced degradation of polymers: polyethylene, polytetrafluoroethylene, and polystyrene
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2010/CP/C0CP00493F
Reference58 articles.
1. Space Applications of Polymeric Materials.
2. Erosion Study of Poly(ethylene tetrafluoroethylene) (Tefzel) by Hyperthermal Atomic Oxygen
3. Shielding from solar particle event exposures in deep space
4. Implementation of ALARA radiation protection on the ISS through polyethylene shielding augmentation of the Service Module Crew Quarters
5. Degradation of Teflon Film Under Radiation of Protons and Electrons
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