Measurement of optical properties in organic photovoltaic materials using monochromated electron energy-loss spectroscopy-Reference-Cited by-同舟云学术

Measurement of optical properties in organic photovoltaic materials using monochromated electron energy-loss spectroscopy

Published:2016 Issue:35 Volume:4 Page:13636-13645
ISSN:2050-7488
Container-title:Journal of Materials Chemistry A
language:en
Short-container-title:J. Mater. Chem. A

Author:

Alexander Jessica A.¹²³⁴⁵,Scheltens Frank J.¹²³⁴⁵,Drummy Lawrence F.⁶⁷⁸⁵,Durstock Michael F.⁶⁷⁸⁵,Gilchrist James B.⁹¹⁰¹¹,Heutz Sandrine⁹¹⁰¹¹,McComb David W.¹²³⁴⁵

Affiliation:

1. Center for Electron Microscopy and Analysis

2. Department of Materials Science and Engineering

3. The Ohio State University

4. Columbus

5. USA

6. Materials and Manufacturing Directorate

7. Air Force Research Laboratory

8. Wright-Patterson Air Force Base, WPAFB

9. Department of Materials

10. Imperial College London

11. UK

Abstract

Spatially resolved mapping of optical properties in organic photovoltaics.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2016/TA/C6TA06201F

Reference38 articles.

1. Origin of the Open Circuit Voltage of Plastic Solar Cells

2. Toward Cost-Effective Solar Energy Use

3. Solution-processed small-molecule solar cells with 6.7% efficiency

4. Thinking small for solar

5. http://www.heliatek.com

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