Pore confined time-of-flight secondary ion electrochemical mass spectrometry-Reference-Cited by-同舟云学术

Pore confined time-of-flight secondary ion electrochemical mass spectrometry

Published:2023 Issue:8 Volume:52 Page:2596-2616
ISSN:0306-0012
Container-title:Chemical Society Reviews
language:en
Short-container-title:Chem. Soc. Rev.

Author:

Wang Jun-Gang¹,Yu Ru-Jia²^ORCID,Hua Xin³,Long Yi-Tao²^ORCID

Affiliation:

1. School of Chemical and Environmental Engineering, Shanghai Institute of Technology, Shanghai 201418, P. R. China

2. State Key Laboratory of Analytical Chemistry for Life Science, School of Chemistry and Chemical Engineering, Nanjing University, Nanjing 210023, P. R. China

3. Jiangsu Engineering Laboratory of Smart Carbon-Rich Materials and Device, School of Chemistry and Chemical Engineering, Southeast University, Nanjing 211189, P. R. China

Abstract

This review highlights the important historical and technological developments of in situ ToF-SIEMS technique, especially, the challenges encountered when extending ToF-SIMS from a high vacuum condition to a liquid electrochemical environment.

Funder

National Natural Science Foundation of China

Shanghai Institute of Technology

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2023/CS/D2CS00575A

Reference154 articles.

1. In situ probing electrified interfacial water structures at atomically flat surfaces

2. Probing and Visualizing Interfacial Charge at Surfaces in Aqueous Solution