Dynamics of the charging-induced imaging instability in transmission electron microscopy-Reference-Cited by-同舟云学术

Dynamics of the charging-induced imaging instability in transmission electron microscopy

Published:2021 Issue:11 Volume:3 Page:3035-3040
ISSN:2516-0230
Container-title:Nanoscale Advances
language:en
Short-container-title:Nanoscale Adv.

Author:

Wang Linhai¹²³⁴,Liu Dongdong¹²³⁴,Zhang Fan⁵⁶⁷⁸⁹,Zhang Zhenyu¹²³⁴^ORCID,Cui Junfeng¹²³⁴,Jia Zhenghao⁵⁶⁷⁸⁹,Yu Zhibin¹²³⁴,Lv Yiqiang¹²³⁴,Liu Wei⁵⁶⁷⁸⁹^ORCID

Affiliation:

1. Key Laboratory for Precision and Non-Traditional Machining Technology of Ministry of Education

2. Dalian University of Technology

3. Dalian 116024

4. China

5. Division of Energy Research Resources

6. Dalian National Laboratory for Clean Energy

7. Dalian Institute of Chemical Physics

8. Chinese Academy of Sciences

9. Dalian 116023

Abstract

It is the first time to clarify a positive charging on grid samples with low conductivity, and quantitatively studied the image drifting dynamics induced by charging via in situ transmission electron microscopy (TEM) imaging.

Funder

National Natural Science Foundation of China

Youth Innovation Promotion Association

Dalian University of Technology

Collaborative Innovation Center of Major Machine Manufacturing in Liaoning

National Basic Research Program of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2021/NA/D1NA00140J

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