Reliable <i>I</i>/<i>V</i> characteristics and long lifetime of porphyrin-based single-molecule junctions-Reference-Cited by-同舟云学术

Reliable I/V characteristics and long lifetime of porphyrin-based single-molecule junctions

Published:2024 Issue:12 Volume:12 Page:4326-4335
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Yao Xinlei¹,Vonesch Maxime²^ORCID,Guan Lihao¹,Wytko Jennifer²^ORCID,Weiss Jean²^ORCID,Sun Xiaonan¹^ORCID,Lacroix Jean-Christophe¹^ORCID

Affiliation:

1. Université de Paris Cité, ITODYS, CNRS-UMR 7086, 15 rue Jean-Antoine de Baïf, 75205 Paris Cedex 13, France

2. Institut de Chimie de Strasbourg, CNRS-UMR 7177, Université de Strasbourg, 4, rue Blaise Pascal, 67000 Strasbourg, France

Abstract

In this work diamino-porphyrin derivatives, in their free base or cobalt complex forms, have been used to construct SMJs.

Funder

Agence Nationale de la Recherche

China Scholarship Council

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/TC/D3TC04142E

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