Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization-Reference-Cited by-同舟云学术

Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization

Published:2019 Issue:10 Volume:6 Page:1991-2002
ISSN:2051-6347
Container-title:Materials Horizons
language:en
Short-container-title:Mater. Horiz.

Author:

Zhao Chonghang¹²³⁴^ORCID,Kisslinger Kim⁵⁶⁷⁴,Huang Xiaojing⁸⁶⁷⁴,Lu Ming⁵⁶⁷⁴,Camino Fernando⁵⁶⁷⁴,Lin Cheng-Hung¹²³⁴,Yan Hanfei⁸⁶⁷⁴,Nazaretski Evgeny⁸⁶⁷⁴^ORCID,Chu Yong⁸⁶⁷⁴,Ravel Bruce⁹¹⁰¹¹⁴,Liu Mingzhao⁵⁶⁷⁴^ORCID,Chen-Wiegart Yu-chen Karen¹²³⁴⁸^ORCID

Affiliation:

1. Department of Materials Science and Chemical Engineering

2. Stony Brook University

3. Stony Brook

4. USA

5. Center for Functional Nanomaterials

6. Brookhaven National Laboratory

7. Upton

8. National Synchrotron Light Source II

9. Materials Measurement Laboratory

10. National Institute of Standards and Technology

11. Gaithersburg

Abstract

Solid-state interfacial dealloying creates bi-continuous nanostructured thin films with 3D interconnected morphology, revealed by multimodal characterization, offering potential applications in catalysis, biomedical sensing and energy storage.

Funder

National Science Foundation

U.S. Department of Energy

Stony Brook University

Brookhaven National Laboratory

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrical and Electronic Engineering,Process Chemistry and Technology,Mechanics of Materials,General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2019/MH/C9MH00669A

Reference58 articles.