Epitaxial ferroelectric Hf0.5Zr0.5O2 thin film on a buffered YSZ substrate through interface reaction

Author:

Li Tao12345ORCID,Zhang Nian6784,Sun Zhenzhong1234,Xie Chunxiao1234,Ye Mao910114,Mazumdar Sayantan1234,Shu Longlong512134,Wang Yu512134,Wang Danyang5141516,Chen Lang5141516,Ke Shanming5121345,Huang Haitao171819204ORCID

Affiliation:

1. School of Mechanical Engineering

2. Dongguan University of Technology

3. Dongguan 523808

4. P. R. China

5. School of Materials Science and Engineering

6. Shanghai Institute of Microsystem and Information Technology

7. Chinese Academy of Sciences

8. Shanghai 200050

9. Department of Physics

10. South University of Science and Technology of China

11. Shenzhen 518055

12. Nanchang University

13. Nanchang 330031

14. The University of New South Wales

15. Sydney

16. Australia

17. Department of Applied Physics and Materials Research Center

18. The Hong Kong Polytechnic University

19. Hung Hom

20. Kowloon

Abstract

In this study, we used pulsed laser deposition to successfully grow epitaxial Hf0.5Zr0.5O2 (HZO) films on (001)-, (011)- and (111)-oriented yttria-stabilized zirconia (YSZ) substrates using TiN as the bottom electrode.

Funder

National Natural Science Foundation of China

Research Grants Council, University Grants Committee

China Postdoctoral Science Foundation

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

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