Application of laser ablation inductively coupled plasma (dynamic reaction cell) mass spectrometry for depth profiling analysis of high-tech industrial materials-Reference-Cited by-同舟云学术

Application of laser ablation inductively coupled plasma (dynamic reaction cell) mass spectrometry for depth profiling analysis of high-tech industrial materials

Published:2005 Issue:5 Volume:20 Page:417
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Balcaen Lieve I. L.,Lenaerts Jens,Moens Luc,Vanhaecke Frank

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2005/JA/B412287A

Reference15 articles.

1. Characterization of the Element Distribution Within TiN Coatings with SIMS

2. Dynamic SIMS: Quantification at All Depths?

3. Quantitative AES-Mapping and Depth Profiling

4. Depth-resolved Anaylsis of Multilayered Samples by Laser-induced Breakdown Spectrometry

5. Comparison of depth resolution for direct current and radiofrequency modes in glow discharge optical emission spectrometry

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