Residual resistivity as an independent indicator of resonant levels in semiconductors

Author:

Wiendlocha Bartlomiej1234ORCID,Misra Shantanu5678ORCID,Dauscher Anne5678,Lenoir Bertrand5678,Candolfi Christophe5678ORCID

Affiliation:

1. Faculty of Physics and Applied Computer Science

2. AGH University of Science and Technology

3. 30-059 Krakow

4. Poland

5. Institut Jean Lamour

6. UMR 7198 CNRS – Université de Lorraine

7. 54011 Nancy Cedex

8. France

Abstract

A novel method which allows to distinguish between resonant and non-resonant impurities in thermoelectric semiconductors is presented.

Funder

Narodowe Centrum Nauki

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrical and Electronic Engineering,Process Chemistry and Technology,Mechanics of Materials,General Materials Science

Reference44 articles.

1. H. J. Goldsmid , Thermoelectric Refrigeration , Springer , New York , 1964

2. Thermoelectrics and Its Energy Harvesting , ed. D. M. Rowe , CRC Press , Boca Raton, FL, USA , 2012

3. Compromise and Synergy in High‐Efficiency Thermoelectric Materials

4. Band Engineering of Thermoelectric Materials

5. Advanced Thermoelectrics: Materials, Contacts, Devices, and Systems , ed. Z. Ren , Y. Lan , Q. Zhang , CRC Press , Boca Raton, FL, USA , 2018

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