Optical properties of thickness-controlled PtSe2 thin films studied via spectroscopic ellipsometry-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Optical properties of thickness-controlled PtSe2 thin films studied via spectroscopic ellipsometry

Published:2020 Issue:45 Volume:22 Page:26383-26389
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

He Junbo¹²³⁴⁵,Jiang Wei⁶⁷⁸⁹¹⁰,Zhu Xudan¹²³⁴⁵^ORCID,Zhang Rongjun¹²³⁴⁵^ORCID,Wang Jianlu⁶⁷⁸⁹¹⁰,Zhu Meiping¹¹¹²⁸¹³¹⁰,Wang Songyou¹²³⁴⁵^ORCID,Zheng Yuxiang¹²³⁴⁵,Chen Liangyao¹²³⁴⁵

Affiliation:

1. Key Laboratory of Micro and Nano Photonic Structures

2. Ministry of Education

3. Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing

4. Department of Optical Science and Engineering

5. Fudan University

6. National Laboratory for Infrared Physics

7. Shanghai Institute of Technical Physics

8. Chinese Academy of Sciences

9. Shanghai 200083

10. China

11. Laboratory of Thin Film Optics

12. Shanghai Institute of Optics and Fine Mechanics

13. Shanghai 201800

Abstract

We revealed the influences of strong interlayer interactions on optical transitions and excitons in layered PtSe₂ films.

Funder

National Natural Science Foundation of China

International Science and Technology Cooperation Programme

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2020/CP/D0CP04021E

Reference47 articles.

1. The rise of graphene

2. Rediscovering black phosphorus as an anisotropic layered material for optoelectronics and electronics

3. Effect of spin-orbit interaction on the optical spectra of single-layer, double-layer, and bulk MoS2

4. Layer-controlled band gap and anisotropic excitons in few-layer black phosphorus

5. Black phosphorus-based van der Waals heterostructures for mid-infrared light-emission applications

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thickness-modulated electronic band structures and exciton behavior of non-van-der-waals 2D Bi2O2Se films;Applied Surface Science;2024-11

2. Synthesis of 2D PtSe₂ Nanolayers on Glass Substrates and Their Integration in Near-Infrared Light Shutters;ACS Omega;2024-03-22

3. Reducing optical loss of dual-ion beam sputtered HfO₂ films via optimization of coating and annealing parameters;Optics Express;2023-11-22

4. Layer‐controlled nonlinear terahertz valleytronics in two‐dimensional semimetal and semiconductor PtSe₂;InfoMat;2023-09-04

5. Enhanced broadband light absorption of ultrathin PtSe₂ in metal–insulator–metal structure;Journal of Physics D: Applied Physics;2023-06-30

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3